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12. Asian Test Symposium 2003: Xian, China

12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. IEEE Computer Society 2003, ISBN 0-7695-1951-2 CiteSeerX Google scholar pubzone.org BibTeX bibliographical record in XML
@proceedings{DBLP:conf/ats/2003,
  title     = {12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian,
               China},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {2003},
  isbn      = {0-7695-1951-2},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Keynote Address

Design for Testabilit

Memory Testing 1

Fault Diagnosis 1

Delay Testing

BIST

Software Testing 1

Mixed-Signal Testing

Test Compaction 1

RTL Verification

Enhanced Delay Testing and ATPG

Test Power

Software Testing 2

Fault Diagnosis

Memory Testing 2

SOC Test

DFT Synthesis

Test Scheduling

Measurement

Test Economics

Memory Testing 3

Current Test

SOC DFT

Test Compaction 2

Functional Testing/Reliability

Formal Verification

Software Testing 3

Poster Session

Copyright © Fri Mar 12 17:06:43 2010 by Michael Ley (ley@uni-trier.de)