IEEE Transactions on Reliability, Volume 54

Volume 54, Number 1, March 2005

• Suprasad V. Amari:
  Comment on: a hazard function approximation used in reliability theory. 2
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• Zehua Chen, Shurong Zheng:
  Lifetime distribution based degradation analysis. 3-10
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• H. Hirose:
  The trunsored model and its applications to lifetime analysis: unified censored and truncated models. 11-21
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• Sangun Park:
  Testing exponentiality based on the Kullback-Leibler information with the type II censored data. 22-26
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• N. Balakrishnan, C.-T. Lin, Ping-Shing Chan:
  A comparison of two simple prediction intervals for exponential distribution. 27-33
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• A. A. Soliman:
  Estimation of parameters of life from progressively censored data using Burr-XII model. 34-42
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• Francis G. Pascual, Grace Montepiedra:
  Lognormal and Weibull accelerated life test plans under distribution misspecification. 43-52
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• Guangbin Yang:
  Accelerated life tests at higher usage rates. 53-57
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• Loon Ching Tang, Kai Xu:
  A multiple objective framework for planning accelerated life tests. 58-63
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• A. A. Alhadeed, Shie-Shien Yang:
  Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. 64-68
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• Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Constantin Halatsis:
  A concurrent built-in self-test architecture based on a self-testing RAM. 69-78
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• Y. Saito, T. Hashinaga, S. Nakajima:
  Effect of CVD-SiO₂ film on reliability of GaAs MESFET with Ti/Pt/Au gate metal. 79-82
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• Zhimin He, Han Tong Loh, Eng Hong Ong:
  A probabilistic approach to evaluate the reliability of piezoelectric micro-actuators. 83-91
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• Ruey Huei Yeh, Gaung-Cheng Chen, Ming-Yuh Chen:
  Optimal age-replacement policy for nonrepairable products under renewing free-replacement warranty. 92-97
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• Winfrid G. Schneeweiss:
  Toward a deeper understanding of the availability of series-systems without aging during repairs. 98-99
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• Yuan-Shun Dai, Min Xie, Kim-Leng Poh:
  Modeling and analysis of correlated software failures of multiple types. 100-106
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• Daniel R. Jeske, Xuemei Zhang, Loan Pham:
  Adjusting software failure rates that are estimated from test data. 107-114
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• Ing-Ray Chen, Baoshan Gu, Sapna E. George, Sheng-Tzong Cheng:
  On failure recoverability of client-server applications in mobile wireless environments. 115-122
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• Kyu-Seek Sohn, Seung Yeob Nam, D. K. Sung:
  A spare bandwidth sharing scheme based on network reliability. 123-132
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• Sieteng Soh, Suresh Rai:
  An efficient cutset approach for evaluating communication-network reliability with heterogeneous link-capacities. 133-144
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• Hosam M. F. AboElFotoh, S. S. Iyengar, K. Chakrabarty:
  Computing reliability and message delay for Cooperative wireless distributed sensor networks subject to random failures. 145-155
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• Antoine Rauzy:
  A m log m algorithm to compute the most probable configurations of a system with multi-mode independent components. 156-158
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• Jian-Ping Li, G. Thompson:
  A method to take account of inhomogeneity in mechanical component reliability calculations. 159-168
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• F. K. Hwang:
  A hierarchy of importance indices. 169-172
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• K. Jenab, B. S. Dhillon:
  Stochastic fault tree analysis with self-loop basic events. 173-180
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• M. V. Frank:
  View through the door of the SOFIA project. 181-188
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Volume 54, Number 2, June 2005

• W. B. Nelson:
  A bibliography of accelerated test plans. 194-197
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• Ji Hwan Cha:
  On optimal burn-in procedures - a generalized model. 198-206
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• K. O. Kim, W. Kuo:
  Some considerations on system burn-in. 207-214
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• Ozgur Sinanoglu, Alex Orailoglu:
  Test power reductions through computationally efficient, decoupled scan chain modifications. 215-223
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• V. E. Johnson, A. Moosman, P. Cotter:
  A hierarchical model for estimating the early reliability of complex systems. 224-231
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• Xinyu Chen, Michael R. Lyu:
  Reliability analysis for various communication schemes in wireless CORBA. 232-242
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• Marzio Marseguerra, Enrico Zio, Luca Podofillini, David W. Coit:
  Optimal design of reliable network systems in presence of uncertainty. 243-253
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• A. Yalaoui, E. Chatelet, Chengbin Chu:
  A new dynamic programming method for reliability & redundancy allocation in a parallel-series system. 254-261
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• H. Gutierrez-Pulido, V. Aguirre-Torres, J. A. Christen:
  A practical method for obtaining prior distributions in reliability. 262-269
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• E. T. Wondmagegnehu, J. Navarro, P. J. Hernandez:
  Bathtub shaped failure rates from mixtures: a practical point of view. 270-275
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• P. Erto, B. Palumbo:
  Origins, properties, and parameters estimation of the hyperbolic reliability model. 276-281
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• C. Park:
  Parameter estimation of incomplete data in competing risks using the EM algorithm. 282-290
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• Liyang Xie, Jinyu Zhou, Xuemin Wang:
  Data mapping and the prediction of common cause failure probability. 291-296
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• Wenjian Li, Hoang Pham:
  Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks. 297-303
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• C. R. Cassady, E. Kutanoglu:
  Integrating preventive maintenance planning and production scheduling for a single machine. 304-309
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• Wei Huang, D. L. Dietrich:
  An alternative degradation reliability modeling approach using maximum likelihood estimation. 310-317
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• Wenjian Li, Hoang Pham:
  An inspection-maintenance model for systems with multiple competing processes. 318-327
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• Yueqin Wu, Jiancheng Guan:
  Repairable consecutive-k-out-of-n: G systems with r repairmen. 328-337
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• Shaomin Wu, D. Clements-Croome:
  Optimal maintenance policies under different operational schedules. 338-346
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• Shey-Huei Sheu, Yuh-Bin Lin, Gwo-Liang Liao:
  Optimal policies with decreasing probability of imperfect maintenance. 347-357
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• Hsing-Chung Liang, Wen-Chin Ho, Ming-Chieh Cheng:
  Identify unrepairability to speed-up spare allocation for repairing memories. 358-365
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• N. Balakrishnan, C.-T. Lin, Ping-Shing Chan:
  Correction to "A Comparison of Two Simple Prediction Intervals for Exponential Distribution". 366
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Volume 54, Number 3, September 2005

• W. B. Nelson:
  A bibliography of accelerated test plans part II - references. 370-373
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• H. K. T. Ng:
  Parameter estimation for a modified Weibull distribution, for progressively type-II censored samples. 374-380
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• Irad E. Ben-Gal:
  On the use of data compression measures to analyze robust designs. 381-388
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• E. S. Ahmed, A. I. Volodin, A. A. Hussein:
  Robust weighted likelihood estimation of exponential parameters. 389-395
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• I. A. Ahmad, M. Kayid, Xiaohu Li:
  The NBUT class of life distributions. 396-401
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• Jie Wu, Feng Gao, Zhongcheng Li, Yinghua Min:
  Optimal, and reliable communication in hypercubes using extended safety vectors. 402-411
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• Li Bai:
  Circular sequential k-out-of-n congestion system. 412-420
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• Fang-Ming Shao, Xuemin Shen, Pin-Han Ho:
  Reliability optimization of distributed access networks with constrained total cost. 421-430
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• Yong Chen, Qingyu Yang:
  Reliability of two-stage weighted-k-out-of-n systems with components in common. 431-440
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• Viera Stopjaková, P. Malosek, M. Matej, Vladislav Nagy, Martin Margala:
  Defect detection in analog and mixed circuits by neural networks using wavelet analysis. 441-448
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• Jie Wu, Zhen Jiang:
  On constructing the minimum orthogonal convex polygon for the fault-tolerant routing in 2-D faulty meshes. 449-458
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• Anurag Tiwari, Karen A. Tomko:
  Enhanced reliability of finite-state machines in FPGA through efficient fault detection and correction. 459-467
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• C. Constantinescu:
  Dependability evaluation of a fault-tolerant processor by GSPN modeling. 468-474
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• Yong Chen, Jionghua Jin:
  Quality-reliability chain modeling for system-reliability analysis of complex manufacturing processes. 475-488
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• J. S. Ivy, S. M. Pollock:
  Marginally monotonic maintenance policies for a multi-state deteriorating machine with probabilistic monitoring, and silent failures. 489-497
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• Todd A. DeLong, D. Todd Smith, Barry W. Johnson:
  Dependability metrics to assess safety-critical systems. 498-505
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• Dazhi Wang, Kishor S. Trivedi:
  Computing steady-state mean time to failure for non-coherent repairable systems. 506-516
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• J. E. Ramirez-Marquez, David W. Coit:
  Composite importance measures for multi-state systems with multi-state components. 517-529
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• C. Park, W. J. Padgett:
  New cumulative damage models for failure using stochastic processes as initial damage. 530-540
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• Yujuan Bao, Xiaobai Sun, Kishor S. Trivedi:
  A workload-based analysis of software aging, and rejuvenation. 541-548
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• M. Agarwal, R. Gupta:
  Penalty function approach in heuristic algorithms for constrained redundancy reliability optimization. 549-558
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Volume 54, Number 4, December 2005

• Saralees Nadarajah, Samuel Kotz:
  On some recent modifications of Weibull distribution. 561-562
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• C. D. Lai, Min Xie, D. N. P. Murthy:
  Reply to "On Some Recent Modifications of Weibull Distribution". 563
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• C. R. Cassady, I. M. Iyoob, K. Schneider, Edward A. Pohl:
  A generic model of equipment availability under imperfect maintenance. 564-571
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• L. Attardi, G. Pulcini:
  A new model for repairable systems with bounded failure intensity. 572-582
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• Chin-Yu Huang, Michael R. Lyu:
  Optimal release time for software systems considering cost, testing-effort, and test efficiency. 583-591
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• Chin-Yu Huang, Michael R. Lyu:
  Optimal testing resource allocation, and sensitivity analysis in software development. 592-603
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• J. Quigley, Lesley Walls:
  Nonparametric bootstrapping of the reliability function for multiple copies of a repairable item modeled by a birth process. 604-611
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• M. P. Kaminskiy, V. V. Krivtsov:
  A simple procedure for Bayesian estimation of the Weibull distribution. 612-616
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