IEEE Transactions on Reliability, Volume 53

Volume 53, Number 1, March 2004

• W. A. Marsh:
  Opinion item: cancelled US-military specifications. 1-2
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• Min-Sheng Lin:
  An O(k²·log(n)) algorithm for computing the reliability of consecutive-k-out-of-n: F systems. 3-6
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• Philip J. Boland, Francisco J. Samaniego:
  Stochastic ordering results for consecutive k-out-of-n: F systems. 7-10
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• C. Park, K. B. Kulasekera:
  Parametric inference of incomplete data with competing risks among several groups. 11-21
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• Chengjie Xiong, Ming Ji:
  Analysis of grouped and censored data from step-stress life test. 22-28
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• U. Balasooriya, C.-K. Low:
  Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring. 29-36
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• Jun Bai, Hoang Pham:
  Discounted warranty cost of minimally repaired series systems. 37-42
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• Shi-Ning Ju, Cheng-Liang Chen, Chuei-Tin Chang:
  Constructing fault trees for advanced process control systems $application to cascade control loops. 43-60
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• M. Fotuhi-Firuzabad, R. Billinton, T. S. Munian, B. Vinayagam:
  A novel approach to determine minimal tie-sets of complex network. 61-70
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• Yash P. Aneja, R. Chandrasekaran, K. P. K. Nair:
  Minimal-cost system reliability with discrete-choice sets for components. 71-76
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• Wei Huang, Ronald G. Askin:
  A generalized SSI reliability model considering stochastic loading and strength aging degradation. 77-82
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• E. L. Meyer, E. E. van Dyk:
  Assessing the reliability and degradation of photovoltaic module performance parameters. 83-92
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• Inki Hong, Miodrag Potkonjak, Ramesh Karri:
  A heterogeneous built-in self-repair approach using system-level synthesis flexibility. 93-101
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• Yong Guan, Xinwen Fu, Riccardo Bettati, Wei Zhao:
  A quantitative analysis of anonymous communications. 103-115
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• Nong Ye, Yebin Zhang, C. M. Borror:
  Robustness of the Markov-chain model for cyber-attack detection. 116-123
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• Roy A. Maxion, Tahlia N. Townsend:
  Masquerade detection augmented with error analysis. 124-147
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• O. Patrick Kreidl, Tiffany M. Frazier:
  Feedback control applied to survivability: a host-based autonomic defense system. 148-166
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Volume 53, Number 2, June 2004

• Liudong Xing, Joanne Bechta Dugan:
  Comments on PMS BDD generation in 'A BDD-based algorithm for Reliability Analysis of phased-mission systems'. 169-173
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• Liudong Xing, Joanne Bechta Dugan:
  A separable ternary decision diagram based analysis of generalized phased-mission reliability. 174-184
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• Rafael Pérez-Ocón, Delia Montoro-Cazorla:
  Transient analysis of a repairable system, using phase-type distributions and geometric processes. 185-192
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• Lirong Cui, W. Kuo, H. T. Loh, M. Xie:
  Optimal allocation of minimal & perfect repairs under resource constraints. 193-199
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• Debra A. Elkins, M. A. Wortman:
  An examination of correlation effects among warranty claims. 200-204
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• Yinong Chen, Zhongshi He:
  Bounds on the reliability of distributed systems with unreliable nodes & links. 205-215
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• Pin-Han Ho, János Tapolcai, H. T. Mouftah:
  On achieving optimal survivable routing for shared protection in survivable next-generation Internet. 216-225
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• M. T. Todinov:
  Reliability governed by the relative locations of random variables following a homogeneous Poisson Process in a finite domain. 226-237
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• Alma Riska, Evgenia Smirni, Gianfranco Ciardo:
  Exact analysis of a class of GI/G/1-type performability models. 238-249
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• K. S. Chandra, T. V. Ramanathan:
  Modeling inefficiencies in a reliability system using stochastic frontier regression. 250-254
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• D. Roy:
  Discrete Rayleigh distribution. 255-260
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• M. S. Finkelstein:
  Alternative time scales for systems with random usage. 261-264
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• M. S. Finkelstein:
  On the exponential formula for reliability. 265-268
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• Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu:
  Enhancing reliability of RTL controller-datapath circuits via Invariant-based concurrent test. 269-278
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• Jingsong Xie, Michael G. Pecht:
  Contact discontinuity modeling of electromechanical switches. 279-283
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• Francis G. Pascual:
  Optimal test planning for the fatigue-limit model when the fatigue-limit distribution is known. 284-292
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• Stefan Dilhaire, Stéphane Grauby, S. Jorez, Wilfrid Claeys:
  Strain energy imaging of a power MOS transistor using speckle interferometry. 293-296
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Volume 53, Number 3, September 2004

• L. Gonzalez, D. Garcia, B. Galvan:
  An intrinsic order criterion to evaluate large, complex fault trees. 297-305
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• A. N. Das, D. Acharya:
  Age replacement of components during IFR delay time. 306-312
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• R. Romera, José E. Valdés, Rómulo I. Zequeira:
  Active-redundancy allocation in systems. 313-318
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• G. Latif-Shabgahi, Julian M. Bass, Stuart Bennett:
  A taxonomy for software voting algorithms used in safety-critical systems. 319-328
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• S. C. Cheung, Samuel T. Chanson, Zhendong Xu:
  Applying generic timing tests for distributed multimedia software systems. 329-341
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• Michele Favalli, Cecilia Metra:
  TMR voting in the presence of crosstalk faults at the voter inputs. 342-348
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• N. Balakrishnan, H. K. T. Ng, N. Kannan:
  Goodness-of-fit tests based on spacings for progressively type-II censored data from a general location-scale distribution. 349-356
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• B. Senoglu, B. Surucu:
  Goodness-of-fit tests based on Kullback-Leibler information. 357-361
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• Jinsheng Huang, Ming J. Zuo:
  Dominant multi-state systems. 362-368
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• David W. Coit, Tongdan Jin, N. Wattanapongsakorn:
  System optimization with component reliability estimation uncertainty: a multi-criteria approach. 369-380
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• Yi-Kuei Lin:
  Reliability of a stochastic-flow network with unreliable branches & nodes, under budget constraints. 381-387
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• E. Gouno, A. Sen, N. Balakrishnan:
  Optimal step-stress test under progressive type-I censoring. 388-393
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• Gregory Levitin:
  Consecutive k-out-of-r-from-n system with multiple failure criteria. 394-400
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• Nozer D. Singpurwalla, Chung-Wai Kong:
  Specifying interdependence in networked systems. 401-405
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• N. Wattanapongsakorn, S. P. Levitan:
  Reliability optimization models for embedded systems with multiple applications. 406-416
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• Yun-Chia Liang, Alice E. Smith:
  An ant colony optimization algorithm for the redundancy allocation problem (RAP). 417-423
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• Marzio Marseguerra, Enrico Zio, Luca Podofillini:
  Optimal reliability/availability of uncertain systems via multi-objective genetic algorithms. 424-434
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• Shey-Huei Sheu, Yu-Hung Chien:
  Minimizing cost-functions related to both burn-in and field-operation under a generalized model. 435-439
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• G.-A. Klutke, Peter C. Kiessler, M. A. Wortman:
  Erratum. 440
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• Erratum. 440
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Volume 53, Number 4, December 2004

• S. Goldberg, Shambhu J. Upadhyaya, W. Kent Fuchs:
  Recovery schemes for mesh arrays utilizing dedicated spares. 445-451
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• Yuan Lin Zhang:
  An optimal replacement policy for a three-state repairable system with a monotone process model. 452-457
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• F. Vanderhaegen, D. Jouglet, Sylvain Piechowiak:
  Human-reliability analysis of cooperative redundancy to support diagnosis. 458-464
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• Sherif M. Yacoub, Bojan Cukic, Hany H. Ammar:
  A scenario-based reliability analysis approach for component-based software. 465-480
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• Seung Min Lee, Chong Hyung Lee, Dong Ho Park:
  Sequential capacity determination of subnetworks in network performance analysis. 481-486
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• Jun Zhao, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi:
  Sequential diagnosis of processor array systems. 487-498
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• Yong Ou, Joanne Bechta Dugan:
  Modular solution of dynamic multi-phase systems. 499-508
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• Andrea Bondavalli, Silvano Chiaradonna, Felicita Di Giandomenico, Ivan Mura:
  Dependability modeling and evaluation of multiple-phased systems using DEEM. 509-522
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• A. E. Gera:
  Combined k-out-of-n: G, and consecutive k_c-out-of-n: G systems. 523-531
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• S. Soni, S. Narasimhan, L. J. LeBlanc:
  Telecommunication access network design with reliability constraints. 532-541
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• Daniel Berleant, Jianzhong Zhang:
  Bounding the times to failure of 2-component systems. 542-550
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• Y. Michlin, B. Sedan, D. Ingman:
  Reliability improvement of Internet web servers through statistical process control. 551-556
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• Nong Ye, Qiang Chen, C. M. Borror:
  EWMA forecast of normal system activity for computer intrusion detection. 557-566
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• Suprasad V. Amari, Hoang Pham, G. Dill:
  Optimal design of k-out-of-n: G subsystems subjected to imperfect fault-coverage. 567-575
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