| 2007 |
|---|
| 3 | EE | Ming Li,
Mo Liu,
Luping Ding,
Elke A. Rundensteiner,
Murali Mani:
Event Stream Processing with Out-of-Order Data Arrival.
ICDCS Workshops 2007: 67 |
| 2 | EE | Mo Liu,
Craig S. Lent:
Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata.
J. Electronic Testing 23(2-3): 211-218 (2007) |
| 2005 |
|---|
| 1 | EE | Ravi K. Kummamuru,
Mo Liu,
Alexei O. Orlov,
Craig S. Lent,
Gary H. Bernstein,
Gregory L. Snider:
Temperature dependence of the locked mode in a single-electron latch.
Microelectronics Journal 36(3-6): 304-307 (2005) |
