| 2007 |
|---|
| 7 | EE | Kalpesh Kapoor,
Jonathan P. Bowen:
Test conditions for fault classes in Boolean specifications.
ACM Trans. Softw. Eng. Methodol. 16(3): (2007) |
| 2006 |
|---|
| 6 | EE | Kalpesh Kapoor:
Formal Analysis of Coupling Hypothesis for Logical Faults.
ISSE 2(2): 80-87 (2006) |
| 2005 |
|---|
| 5 | EE | Kalpesh Kapoor,
Jonathan P. Bowen:
A formal analysis of MCDC and RCDC test criteria.
Softw. Test., Verif. Reliab. 15(1): 21-40 (2005) |
| 2004 |
|---|
| 4 | EE | Kalpesh Kapoor,
Jonathan P. Bowen:
Ordering Mutants to Minimise Test Effort in Mutation Testing.
FATES 2004: 195-209 |
| 3 | EE | Kalpesh Kapoor,
Jonathan P. Bowen:
Experimental evaluation of the tolerance for control-flow test criteria.
Softw. Test., Verif. Reliab. 14(3): 167-187 (2004) |
| 2003 |
|---|
| 2 | EE | Sergiy A. Vilkomir,
Kalpesh Kapoor,
Jonathan P. Bowen:
Tolerance of Control-Flow Testing Criteria.
COMPSAC 2003: 182-187 |
| 1 | EE | Kalpesh Kapoor,
Jonathan P. Bowen:
Experimental Evaluation of the Variation in Effectiveness for DC, FPC and MC/DC Test Criteria.
ISESE 2003: 185-194 |
